Abstract
• In situ thin film bulge test on nc-AlSc is effective method for irradiation induced creep. • Preexisting Al 3 Sc precipitates suppress irradiation induced creep deformation. • Transition regime of AlSc binary system is located between room temperature and 75 °C. In-situ irradiation induced creep(IIC) measurements on a nanocrystalline AlSc 1.1 binary alloy were performed using a thin-film bulge test technique. A thin film bulge technique was employed since any substrate effect can be excluded, and hence is beneficial to analyze the intrinsic properties of specimen. Here, an as-deposited film and a pre-annealed film, both underwent heavy ion irradition with 1.8 MeV Kr ions. Al 3 Sc precipitates in the pre-annealed samples appear to reduce the irradiation creep compliance. Dissolution of these precipitates during irradiation led to increased irradiation creep rates. Microstructural evolution during irradiation was investigated by transmission electron microscopy and high resolution transmission electron microscopy.
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