In situ investigation of helium fuzz growth on tungsten in relation to ion flux, fluence, surface temperature and ion energy using infrared imaging in PSI-2

Abstract

Tungsten is a candidate material for plasma-facing components in nuclear fusion reactors. In operation it will face temperatures >800 K together with an influx of helium ions. Previously, the evolution of special surface nanostructures called fuzz was found under these conditions in a limited window of surface temperature, ion flux and ion energy. Fuzz potentially leads to lower heat load tolerances, enhanced erosion and dust formation, hence should be avoided in a fusion reactor. Here the fuzz growth is reinvestigated in situ during its growth by considering its impact on the surfaces infrared emissivity at 4 μm wavelength with an infrared camera in the linear plasma device PSI-2. A hole in the surface serves as an emissivity reference to calibrate fuzz thickness versus infrared emissivity. Among new data on the above mentioned relations, a lower fuzz growth threshold of 815 ± 24 K is found. Fuzz is seen to grow on rough and polished surfaces and even on the hole’s side walls alike. Literature scalings for thickness, flux and time relations of the fuzz growth rate could not be reproduced, but for the temperature scaling a good agreement to the Arrhenius equation was found.