Abstract

Carbon nanotubes (CNTs) and epitaxial graphene on SiC substrates formed by thermal decomposition are of great interest for electronic and optoelectronic applications. The initial decomposition process of a SiC surface is critical to the formation of subsequent nanocarbon materials, such as CNTs or graphene. We present here an in situ near-edge X-ray absorption fine structure (NEXAFS) spectroscopy study of the initial formation processes of CNTs on the SiC C-face and graphene on the Si-face by thermal decomposition at high temperature. On both surfaces, desorption of Si atoms and subsequent graphitization of the remaining carbon atoms were observed above 1000 °C by carbon K-edge NEXAFS measurements in real time, but the incidence angle dependence of NEXAFS spectra showed marked difference between the SiC C-face and Si-face; on the SiC Si-face, the orientations of graphene layers are kept parallel to the surface during the graphene growth. In contrast, on the SiC C-face, graphene layers are initially orient...

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call