Abstract
The cover picture shows an grazing incidence small angle X-ray scattering pattern of a granular Ag(6nm)-FePt(7.5nm)-Ag-FePt thin film using an in-situ magnetron sputtering chamber measured directly after growth at the Beamline BM20 (ROBL) at the ESRF. The sequential deposition provides separated, faceted FePt nanoislands without any magnetic property degradation and with magnetic moments preferentially oriented parallel to layer surface. The central part of the picture was blocked by a beam stop to avoid an over-saturation of the CCD detector. More details can be found in the article by Jörg Grenzer et al. on page 478.
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