Abstract
The optical constants and thickness of anodic oxide films formed on titanium surface, during the polarization, have been determined in 0.5 M H 2SO 4 by in situ ellipsometric measurements. The anodic titanium films are formed in the voltage region from 0 to 100 V. The possibility of determining the real part film refractive index without direct utilization of the metal substrate refractive index has been shown.
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