In situ determination of the optical constants of titanium surface films formed in higher voltage anodization

Abstract

The optical constants and thickness of anodic oxide films formed on titanium surface, during the polarization, have been determined in 0.5 M H 2SO 4 by in situ ellipsometric measurements. The anodic titanium films are formed in the voltage region from 0 to 100 V. The possibility of determining the real part film refractive index without direct utilization of the metal substrate refractive index has been shown.