Abstract
Understanding the chemo-mechanics during oxidation is of great importance for designing novel countermeasures for materials protections. However, it is yet challenging to accurately measure the coupled mechanical stress/strain components at micro-/nanoscale. In this work, we propose a novel method to combine surface markers (SiO2 micro-pillars) and high temperature scanning probe microscopy (HTSPM) for quantifying the growing oxide thickness, while mapping the local displacement and strain fields at the surface of a nickel-based alloy during high temperature oxidation. The proposed method displays great potential in quantitatively mapping the non-uniform oxide distribution, providing a novel approach to investigate the high-temperature oxidation process.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
