Abstract

We demonstrate control over the three-dimensional (3D) structure of suspended 2D materials in a transmission electron microscope. The shape of our graphene samples is measured from the diffraction patterns recorded at different sample tilts while applying tensile strain on the sample carrier. The changes in the shape of the pattern and in individual diffraction spots allow us to analyze both corrugations and strain in the lattice. Due to the significant effect of ripples and strain on the properties of 2D materials, our results may lead to new ways for their engineering for applications.

Highlights

  • Graphene and other 2D materials differ from conventional bulk due to their extreme surface-to-bulk ratio and exotic properties resulting from quantum confinement of the electrons, and because their structure can extend to the third available spatial dimension

  • We use transmission electron microscopy (TEM) to study ripples in as-prepared free-standing graphene, and further demonstrate that they can be controlled by applying uniaxial strain on the material in situ inside the microscope

  • We demonstrate in situ control of corrugations in freestanding graphene inside a transmission electron microscope

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Summary

Introduction

Graphene and other 2D materials differ from conventional bulk due to their extreme surface-to-bulk ratio and exotic properties resulting from quantum confinement of the electrons, and because their structure can extend to the third available spatial dimension. This allows graphene to closely follow surface corrugations when supported on rough substrates[1] and leads to a ripple structure in suspended graphene membranes.[2,3]. Control over the ripple structure is important for the science and applications of graphene, as well as other 2D materials. An aligned ripple structure is created, that could be used to introduce anisotropy for the charge and thermal transport in the material, paving way for new applications

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