In situ calibration of a flat-field grazing incidence spectrograph with an x-ray charge-coupled device camera using a transmission grating and a laser-produced plasma for x-ray laser research

Abstract

An in situ calibration experiment of a soft x-ray spectrograph for x-ray laser research has been performed. The calibrated spectrograph was a flat-field grazing incidence spectrometer with an x-ray charge-coupled device camera. The absolute sensitivity of the spectrograph was obtained for the wavelength range from 2.6 to 4.0 nm using a transmission grating spectrograph as a reference spectrograph set along the axial direction of a line-focused laser-produced plasma. The absolute sensitivity determined in this work shows nearly the same value as that deduced from the calibration experiment using synchrotron radiation.