Abstract
The in-plane rotation of magnetic stripe domains in a 65-nm magnetostrictive ${\mathrm{Fe}}_{0.8}{\mathrm{Ga}}_{0.2}$ epitaxial film was investigated combining magnetic force microscopy, vibration sample magnetometry, and x-ray resonant magnetic scattering measurements. We analyzed the behavior of the stripe pattern under the application of a bias magnetic field along the in-plane direction perpendicular to the stripe axis, and made a comparison with the analogous behavior at remanence. The experimental results have been explained by means of micromagnetic simulations, supported by energy balance considerations. Fields smaller than $\ensuremath{\sim}400$ Oe do not induce any stripe rotation; rather, a deformation of the closure domains pattern was evidenced. Larger fields produce a sudden rotation of the stripe structure.
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