Abstract
We have fabricated intrinsic Josephson bridges using Tl-Ba-Ca-Cu-O thin films grown on vicinal lanthanum aluminate substrates. Measurements of the lock-in transition allow us align a magnetic field of up to 4 T with the copper oxide planes to better than 0.3/spl deg/. This allows us to study the dynamics of Josephson fluxons in the films. For fields above 1.4 T and at low currents we observe Josephson flux creep. Above a field-dependent threshold current we observe free flow of the fluxons with a flux-flow resistance which is proportional to field. The fluxons reach a field-independent velocity before the jump to the quasiparticle branch occurs. Our results suggest that the development of a sub-mm-wave oscillator using these bridges will require sub-micron patterning.
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