Abstract
Silicon-Lithium based rechargeable batteries offer high gravimetric capacity. However cycle life and electrode microstructure failure mechanisms remain poorly understood. Here we present an X-ray tomography method to investigate in-operando lithiation induced stress cracking leading to the delamination of a composite Si based electrode. Simultaneous voltage measurements show increased cell resistance correlating with severe delamination and microstructural changes. 3D analysis revealed 44.1% loss of the initial electrode-current collector area after 1 hour of operation at 2.4 mA/cm2 and a 21.2% increase in new anode surface area. The work represents a new basis for future investigation of Si based anodes.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
