Abstract
The resolution that may be achieved in an image formed by reconstruction from an in-line electron hologram, without aberration correction, is governed by the source size. Computer simulations show that ultrahigh resolution, of better than 0.05 nm for 100 keV electrons, may be possible if the electron source is a crossover formed at the exit face of a thin atomic-focuser crystal when electrons from a beam focused in a scanning transmission electron microscope (STEM) instrument are channeled along a line of atoms through the crystal. Simulations also show that, because of the channeling effect, the resolution of the reconstructed image is not degraded by translations or oscillations of the STEM beam by 0.1 nm or more. We suggest a scheme for removing the unwanted background and conjugate image from the reconstructed image by combining the in-line holography with an off-axis mode.
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