Abstract
Radial profiles of impurity transport coefficients of argon have been successfully obtained in Large Helical Device, using an assembly equipped with conventional semiconductor detectors and soft x-ray pulse-height analyzers. Several fixed argon discharges have enabled the radial scanning of the assembly to measure the radial profiles of argon-Kα lines. The present experimental results indicate that the impurity transport study becomes possible with the soft x-ray pulse-height analyzers.
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