Abstract
The average impurity concentration of chemical vapor transported (CVT) and vapor liquid solid (VLS) grown CuInS 2 has been determined by spark source mass spectrometry (SSMS). Transition metal impurities range between 10 17 atoms cm −3 (Ti, V, Cr, Co, Ni, Zn) and (3–5)×10 18 atoms cm −3 (Mn, Fe). On heterogeneous VLS grown samples, the Fe content of the CuInS 2 host material and of foreign incorporated phases has been compared by inductive coupled plasma spectrometry (ICP). The foreign phases, particularly In spheres, show a drastically increased impurity content. The results are discussed assuming impurity scavenging by metallic In.
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