Impurities in Nanocrystal Thin-Film Transistors Fabricated by Cation Exchange.

Abstract

Cation exchange is a versatile tool used to alter the composition of nanostructures and thus to design next-generation catalysts and photonic and electronic devices. However, chemical impurities inherited from the starting materials can degrade device performance. Here, we use a sequential cation-exchange process to convert PbSe into CdSe nanocrystal thin films and study their temperature-dependent electrical properties in the platform of the thin-film transistor. We show that residual Pb impurities have detrimental effects on the device turn-on, hysteresis, and electrical stability, and as the amount increases from 2% to 7%, the activation energy for carrier transport increases from 38(3) to 62(2) meV. Selection and surface functionalization of the transistor's gate oxide layer and low-temperature atomic-layer deposition encapsulation of the thin-film channel suppress these detrimental effects. By conversion of the nanocrystal thin films layer upon layer, impurities are driven away from the gate-oxide interface and mobilities improve from 3(1) to 32(3) cm2 V-1 s-1.