Abstract
A novel optimization-enabled electromagnetic transient simulation approach is proposed for calculating the resistor setting of a multistage impulse generator for insulation impulse testing of high-voltage transformers. This approach enables test engineers to overcome most of the major challenges attributed to the use of conventional trial-and-error methods for determining resistor settings, including the excessive time consumption and the potential damage to the test transformer due to a greater number of trial tests. The proposed method uses the frequency response of the test transformer to synthesize a circuit model for it. The test setup, including the test transformer and the impulse generator, is simulated using an electromagnetic-transients-type simulator. A genetic-algorithm-based approach is used to optimize the setting of the impulse generator. Optimized resistor values are then used in impulse testing of a three-phase power transformer. Different cases of impulse generator resistor arrangements are studied in this paper and simulated waveforms are compared with those obtained from measurements.
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