Abstract
An augmented defect diagnosis procedure removes tests from consideration in order to improve the accuracy of defect diagnosis by reducing the number of candidate faults. This work studies the role of diagnostic test generation in this context. Diagnostic test generation increases the number of tests that are used for defect diagnosis in order to increase its accuracy. The combined effect of using diagnostic test generation and the augmented defect diagnosis procedure is to add and remove tests in order to improve the accuracy of diagnosis. This study suggests a flow for a two-phase defect diagnosis process that combines the two procedures. Some of the issues that arise, and are addressed by this study, are: (i) which faults to target during diagnostic test generation, (ii) how to restart the augmented defect diagnosis procedure after diagnostic test generation, and (iii) how many of the diagnostic tests the augmented defect diagnosis procedure will remove.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
