Abstract

Raman imaging has been proven to be a powerful analytical technique for the characterization and visualization of chemical components in a range of products, particularly in the food and pharmaceutical industries. The conventional backscattering Raman imaging technique for the spatial analysis of a deep layer suffers from the presence of intense fluorescent and Raman signals originating from the surface layer which mask the weaker subsurface signals. Here, we demonstrated the application of a new reflection amplifying method using a background mirror as a sample holder to increase the Raman signals from a deep layer. The approach is conceptually demonstrated on enhancing the Raman signals from the subsurface layer. Results show that when bilayer samples are scanned on a reflection mirror, the average signals increase 1.62 times for the intense band at 476 cm−1 of starch powder, and average increases of 2.04 times (for the band at 672 cm−1) for a subsurface layer of high Raman sensitive melamine powder under a 1 mm thick teflon sheet. The method was then applied successfully to detect noninvasively the presence of small polystyrene pieces buried under a 2 mm thick layer of food powder (a case of powdered food adulteration) which otherwise are inaccessible to conventional backscattering Raman imaging. In addition, the increase in the Raman signal to noise ratio when measuring samples on a mirror is an important feature in many applications where high-throughput imaging is of interest. This concept is also applicable in an analogous manner to other disciplines, such as pharmaceutical where the Raman signals from deeper zones are typically, substantially diluted due to the interference from the surface layer.

Highlights

  • Raman spectroscopy with an imaging component called Raman imaging has become a versatile analytical technique with wide use, spanning from agro-food and pharmaceutical analysis, biological and biochemical sectors, forensic science, material science analysis, and art work, to name a few [1,2,3,4].The main advantage of Raman spectroscopy over near-infrared (NIR) spectroscopy is that Raman spectra show distinct and well-resolved peaks, and a big advantage of using Raman spectroscopy over infrared (IR) is that the sample preparation is much easier and less time consuming

  • As it has been stated that the conventional backscattering Raman spectroscopy is only suitable for surface or minimal subsurface analysis [24], the greater contribution to the Raman signals is from the superficial layer

  • If the material in the bottom layer of the sample is less Raman sensitive, weak Raman signals originating from the bottom layer will possibly be overwhelmed by either the fluorescence or noise generated from the superficial layer

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Summary

Introduction

Raman spectroscopy with an imaging component called Raman imaging has become a versatile analytical technique with wide use, spanning from agro-food and pharmaceutical analysis, biological and biochemical sectors, forensic science, material science analysis, and art work, to name a few [1,2,3,4].The main advantage of Raman spectroscopy over near-infrared (NIR) spectroscopy is that Raman spectra show distinct and well-resolved peaks, and a big advantage of using Raman spectroscopy over infrared (IR) is that the sample preparation is much easier and less time consuming. Raman signal intensity can be conventionally improved by using a high power laser source and/or by increasing the exposure time, allowing more photons to reach the detector These typical solutions can lead to sample destruction. Resonance Raman spectroscopy is another way to increase the Raman signals by choosing an excitation (laser) wavelength carefully to match with the electronic absorption bands of a compound or material of interest. Such a combination can result in scattering intensities which increase several fold [5]. Since this technique is sample-centric, it cannot be considered a global solution of the aforementioned problems associated with Raman spectroscopy

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