Abstract

AbstractBackground: Excessive application of nitrogen (N) fertilizer in cereal crops not only decreases the N use efficiency but also accelerates greenhouse gas (GHG) emission.Aim: To improve N use efficiency in wheat (Triticum aestivum L.) using precision N management and coating seeds with arbuscular mycorrhizal fungi (AMF).Methods: Field experiment laid out in split‐plot design was conducted to study the role of AMF consortia (four species) seed coating and different precision N management strategies in rationalizing fertilizer N use.Results: The AMF seed coating improved mycorrhization but did not improve N assimilation, grain yield, root weight, N uptake, chlorophyll value, normalized difference vegetative index, and physiological efficiency (PEN) of applied N fertilizer. The benefits of AMF seed coating in improving N assimilation were not visible even in no‐N treatment. Precision N management using leaf color chart (LCC), chlorophyll meter (SPAD), and GreenSeeker optical sensor (GS) sustained wheat grain yield equivalent to the soil‐test based N fertilizer recommendation with the average savings of 20% N fertilizer. Precision N management strategies improved mean recovery efficiency (REN) and partial factor productivity (PFPN) of applied N fertilizer, respectively by 26.0% and 26.4% over the soil‐test based N management. Spectral properties measured with LCC, SPAD and GS showed good correlation (R2 > 0.71) with grain yield, depicting great potential of optical sensing tools in predicting grain yield and inferring need‐based fertilizer N topdressings decisions in wheat.Conclusions: Precision N management provides a potential solution to improve N nutrition in wheat while reducing nitrous oxide (N2O) and total GHG emissions by 23.2 and 23.6%, respectively, in comparison to soil‐test based N application.

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