Abstract
Intrusion Detection in the Industrial Internet of Things (IIoT) concentrations on the security and safety of critical structures and industrial developments. IIoT extends IoT principles to industrial environments, but linked sensors and devices can be deployed for monitoring, automation, and control of manufacturing, energy, and other critical systems. Intrusion detection systems (IDS) in IoT drive to monitor network traffic, device behavior, and system anomalies for detecting and responding to security breaches. These IDS solutions exploit a range of systems comprising signature-based detection, anomaly detection, machine learning (ML), and behavioral analysis, for identifying suspicious actions like device tampering, unauthorized access, data exfiltration, and denial-of-service (DoS) attacks. This study presents an Improving Intrusion Detection using Satin Bowerbird Optimization with Deep Learning (IID-SBODL) model for IIoT Environment. The IID-SBODL technique initially preprocesses the input data for compatibility. Next, the IID-SBODL technique applies Echo State Network (ESN) model for effectual recognition and classification of the intrusions. Finally, the SBO algorithm optimizes the configuration of the ESN, boosting its capability for precise identification of anomalies and significant security breaches within IIoT networks. By widespread simulation evaluation, the experimental results pointed out that the IID-SBODL technique reaches maximum detection rate and improves the security of the IIoT environment. Through comprehensive experimentation on both UNSW-NB15 and UCI SECOM datasets, the model exhibited exceptional performance, achieving an average accuracy of 99.55% and 98.87%, precision of 98.90% and 98.93%, recall of 98.87% and 98.80%, and F-score of 98.88% and 98.87% for the respective datasets. The IID-SBODL model contributes to the development of robust intrusion detection mechanisms for safeguarding critical industrial processes in the era of interconnected and smart IIoT environments.
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More From: International Journal of Electrical and Electronics Research
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