Abstract
By rf-modulating the current of an electron beam ion source and trap (EBIS/T) the ion distribution is significantly influenced by the simultaneously modulated radial trapping potential. It has been observed that highly charged ions are preferentially accumulated near the axis, showing a substantial reduction of their emittance. Furthermore, by using the appropriate cyclotron frequency adjusted according to the shift caused by the space charge of the electron beam it is possible to remove ions with specific mass to charge ratio from the trap. Rf-heating of low charged argon ions during stepwise ionization is enhancing the yield of highly charged argon ions.
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