Abstract
Logometric impedance meter with variational correction of the uncertainty, caused by finite loop amplification and admittance between protecting amplifier inputs has been developed. To correct named uncertainty, the variation of the protecting amplifier gain is provided and additional measurement of the voltage drop on the standard is implemented. Appropriate calculation eliminates influence of the described uncertainty source on the result of measurement. Proposed approach has been used in the logometric impedance meter MNS1200, delivered to Siberian Institute of Metrology to be used in secondary standard of inductance for frequency up to 1 MHz.
Highlights
To measure impedance parameters first investigators used balanced bridge devises or movable-pointer indicators [1, 2]
Proposed approach has been used in the logometric impedance meter MNS1200, delivered to Siberian Institute of Metrology to be used in secondary standard of inductance for frequency up to 1 MHz
Last type of measurement instruments was very simple but had rather big errors, because of the result of measurement depended on the applied voltage. This situation sharply changes from the beginning of seventies, when the first integral Operational Amplifiers (OpAmp) and Microprocessors were developed
Summary
To measure impedance parameters first investigators used balanced bridge devises or movable-pointer indicators [1, 2]. Abstract Logometric impedance meter with variational correction of the uncertainty, caused by finite loop amplification and admittance between protecting amplifier inputs has been developed. The variation of the protecting amplifier gain is provided and additional measurement of the voltage drop on the standard is implemented.
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