Abstract
The stepping motor control system used in the profile monitor and RCS collimator of J-PARC is configured by VME-based. Most of these pieces of control equipment are in use for more than 10 years. Therefore, countermeasures against aging of equipment are necessary. In addition, it is necessary to implement countermeasures against malfunction of the control system, which is thought to be caused by radiation. In 2016, a malfunction occurred in the motor control system of the RCS collimator. Taking this as a starting point, we began developing a motor control system that can ensure equipment safety even if a malfunction occurs. In this paper, we show the inference of the cause of this malfunction and present details of the developed high-safety motor control system.
Highlights
Stepping motors are used in the driving systems of profile monitors, collimator, and other components in JPARC Linac and RCS
We show the inference of the cause of this malfunction and present details of the developed highsafety motor control system
In addition to aging, we infer that an abnormality occurred in the semiconductor device owing to radiation, and a malfunction occurred in the VME
Summary
Stepping motors are used in the driving systems of profile monitors, collimator, and other components in JPARC Linac and RCS. It is not clear whether this damage to the collimator was caused by a VME malfunction This possibility cannot be ruled out because remote operation could not be performed normally. During test (ii), a completely different problem occurred with one profile monitor of RCS In this case, there was no problem related to equipment monitoring (current position of wire, ON/OFF status of hardware limit switches), but a few operations could not be executed normally. There was no problem related to equipment monitoring (current position of wire, ON/OFF status of hardware limit switches), but a few operations could not be executed normally This malfunction could not be solved by restarting the VME, and normal motor control system operation could be restored only by replacing the CPU board. In addition to aging, we infer that an abnormality (single event effects) occurred in the semiconductor device owing to radiation (low energy neutron), and a malfunction occurred in the VME
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