Abstract
The microwave electric field intensity is precisely measured by the Autler–Townes splitting of electromagnetically induced transparency spectrum in a 5S1/2−5P3/2−57D5/2−58P3/2 four-level ladder-type 85Rb atomic system. A robust multi-carrier modulation scheme is employed to improve the spectral signal-to-noise ratio, which determines the optical readout of Rydberg atom-based microwave electrometry. As a result, a factor of 2 measurement sensitivity improvement is clearly achieved compared with the on resonant Autler–Townes splitting case credit to the advantage of matched filtering. This research paves the way for building a high sensitivity, portable sensor and offers a platform for achieving compact and sensitive receiver.
Highlights
Atom-based measurements have been successfully used as time, length, and frequency standards due to the unique properties of atoms and molecules [1,2]
The electromagnetically induced transparency (EIT) spectroscopy is obtained by applying the coupling laser excites the atoms to Rydberg state when the probe laser is used to detect the response of the atom, which results in the transparency of the atoms
We demonstrate the improvement performance of the microwave E-field measurement sensitivity by using the multi-carrier modulation (MCM) scheme in a four-level atomic system
Summary
Atom-based measurements have been successfully used as time, length, and frequency standards due to the unique properties of atoms and molecules [1,2]. The measurement of microwave electric field (E-field) based on a Rydberg atom demonstrates advantages of traceability and self-calibration [3,4,5,6,7] by using the concept of electromagnetically induced transparency (EIT) [8,9] in a room temperature vapor cell. The E-field measurement based on the Rydberg atoms can be developed as a broadband, direct SI-traceable, and self-calibrating sensor. The measurement by Rydberg atoms poses some difficulties for weak field intensity measurement lower than ∼ μVcm−1 In those cases, there is a pressing need to develop an experiment scheme, which is self-calibrating and with high sensitivity. We demonstrate the improvement performance of the microwave E-field measurement sensitivity by using the MCM scheme in a four-level atomic system. This work is helpful to improve the measurement sensitivity and contribute to the potential application of quantum sensing
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