Abstract
The effect of in-plane lattice matching on the magnetic and read/write properties has been quantitatively studied in CoCr/sub 24/Pt/sub 12/B/sub 4/ or CoCr/sub 20/Pt/sub 8/Ta/sub 4/ media grown on Cr, CrMo/sub 20/ and CrMo/sub 20//Cr underlayer. It is found that by using CrMo/sub 20/ (5 nm)/Cr (5 nm) dual underlayer, significant improvement of magnetic and R/W properties are realized. It is clarified that: (1) the utilization of CrMo/Cr dual underlayer increases H/sub c/ mainly due to the improvement of in-plane crystallographic orientation; (2) the lattice misfit has a small effect on the improvement of in-plane crystallographic orientation. The improvement of in-plane crystallographic orientation by using CrX/Cr dual underlayer is suggested to be due to lattice strain at the interface of Cr and CrX underlayer, which enhances the grain growth of the magnetic layer.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have