Abstract
The effects of chemical sulphuration on GaSb mesa photodiodes performance were investigated by electrical characterization. (NH 4) 2S treatment was found to be very effective in reducing the reverse dark currents by one module value, leading them down to I = 0.2 μ A (V = 1 V) for a φ = 60μ m diameter diode. The capacitance variation versus frequency, investigated from 10 kHz to 1 MHz, becomes flat over the whole range of frequency, attesting of a volume conduction mechanism. These performances exhibited a remarkable stability during 1 year, without encapsulation. The X-ray photoelectron spectrum of the Sb 3d level shows that after (NH 4) 2S treatment the surface is free of native Sb oxides, Sb-.sbnd;S bonds being created by the adsorption of sulphur atoms on the surface These surface modifications are responsible for the observed improvement in characteristics and their stability.
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