Abstract
Vacuum deposited Cd0.5Zn0.5Te thin films of different thicknesses (161–450 nm) prepared by thermal evaporation in vacuum, were found to correspond to a polycrystalline cubic crystal system and exhibited p-type semiconducting behaviour. Film optical constants were determined from transmittance and reflectance measurements at normal light incidence in the spectral range (500–2000 nm). It was found that both the refractive index (n) and the absorption index (k) are independent of the film thickness. Analysis of n(λ) shows normal dispersion. An energy gap of 1.72 eV was determined and attributed to allowed direct optical transitions.
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