Abstract
Due to strict requirements for high-tech processes, yield is an essential performance measure of quality output and affects production economics significantly. Yield is a performance index that significantly influences the optimal decision on profit and production quantity. For instance, in micro light-emitting diodes (MicroLED) manufacturing, the yield of surface mounting highly affects the production cost. To guarantee the production decision is reliable, accurately evaluating yields is crucial. However, the existing yield evaluation method for asymmetric processes with a very low fraction of defective by process capability index is conservative and may mislead the decisions. In this paper, a revised unbiased estimator is investigated and a weighted parametric bootstrap method for accurate production decision making is provided. With extensive comparisons, the proposed method outperforms the existing analytical method and considerably improves the precision of yield evaluation. We also provided managerial insights for a profit with various yield measure methods. For demonstration, an application of production yield determination for a printed circuit board process for MicroLED is presented.
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