Abstract

Aminopropylsilatrane (AP-silatrane) was investigated as an adhesive layer for anchoring Au nanoparticles on silicon substrates. We compared the preparation procedure and film quality of the AP-silatrane films to those of 3-aminopropyltriethoxysilane (APTES), which is commonly used for nanoparticle attachment on silicon. The films were characterized by Fourier Transform infrared (FTIR) spectroscopy, contact angle measurements, and atomic force microscopy (AFM). The process for preparing the AP-silatrane films was much easier and resulted in more reproducibly high quality films due to its insensitivity to water. In surface roughness measurements, we observed a 39% increase (99 pm RMS) for the AP-silatrane film over that of a plasma-cleaned silicon sample (71 pm RMS). In contrast, we observed a 218% increase (226 pm RMS) for the APTES film. The much higher roughness observed for the APTES film was due to its sensitivity to water, which results in molecular aggregate formation and polymerization. Gold nanoparticles (7.5 nm) were deposited and firmly anchored to both types of film surfaces. The measured height of the particles on the films was less than the actual size of the particles, and plasma treatment was used to remove the organic layer, resulting in a corrected measurement of the particle size. AP-silatrane offers an easy preparation procedure that creates a smooth, aggregate-free adhesive layer for anchoring Au nanoparticles strongly to silicon substrates.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call