Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and The Local Electronic Structure

Abstract

Abstract The local electronic structure of ceramic materials can be determined from valence electron energy loss (Veel) spectra via the dielectric function. The quality of the data is comparable to vacuum ultraviolet spectroscopy with the added benefit of high spatial resolution. We have built and implemented a system for spectrum imaging which not only allows automatic data acquisition but also analysis of the full data set. The system consists of a Gatan PEELS and a Gatan Digiscan fitted to a VG HB501 UX STEM and home-built hardware additions. The hardware extensions allow to acquire 1, 2, 3, 4 or 8 spectra for each pixel and in the case of 2 spectra/pixel to vary the exposure time of the specimen to the primary electron beam by controlling the beam blanker (Fig. 1). The first spectrum (2 to 20 ms) contains an unsaturated zero loss peak and the second spectrum (0.05 to 100 s) at the same position the plasmon peak near to but below saturation (Fig. 2).