Abstract
This paper proposes a comprehensive Markov model to study the reliability performance of the conventional isolated multiple-switch pulse width modulation DC-DC (IMSDC-DC) converters including full-bridge, half-bridge and push-pull DC-DC topologies. The suggested model helps to achieve more precise outcomes with a better reflection of the real-world operation characteristics by (i) relying on self-embedded fault tolerant capability of the IMSDC-DC converters, (ii) considering the probability of both short and open circuit (SC and OC) faults in each component, (iii) assessing the effect of semiconductors’ SC/OC probability on the converters’ reliability, (iv) analyzing the continuous and discontinuous conduction modes, (v) updating the operational characteristics of the converters after each fault occurrence, and (vi) evaluating control of the converters to have more durable power transfer in some post-fault cases. Then, the model is applied to assess the effects of duty cycle, output power, voltage gain and transformer turns ratio on the overall reliability and mean time to failure. Practical analytic conclusions are followed by some experimental results to verify the accuracy of the proposed model.
Highlights
Markov models are widely utilized as a solution approach for probabilistic problems in general [1], [2] and reliability evaluation of power electronic converters in particular [3]–[5]
THE PROPOSED MARKOV MODEL According to the explained corresponding probable operation state of each SC or OC fault scenario, the proposed Markov models of the IMSDC-DC converters are illustrated in Fig. 2, where four, five and four states are allocated for FB, HB and PP converters, respectively
PROPOSED MODEL IMPLEMENTATION: RELIABILITY ASSESSMENT RESULTS In this study, the IMSDC-DC converters’ components are designed according to [29] with Lm = 5 mH, LLk = 500 μH, C1 = C2 = Co = 33 μF and R = 100, which lead to the boundary duty cycle of DB = 0.3
Summary
Markov models are widely utilized as a solution approach for probabilistic problems in general [1], [2] and reliability evaluation of power electronic converters in particular [3]–[5]. Reliability-driven operation analytics of a conventional buck-boost converter is discussed in [10], where the effects of input voltage, output power and duty cycle are assessed through a two-state Markov model. In [11], two Markov models are used to simulate the reliability of a single- and a two-stage conventional boost converter with the main aim to evaluate the converter under full or half power in post-fault operation. In [14], the impacts of switch and capacitor series resistances on the operation point of other components and overall reliability degradation of a boost converter are analyzed through the obtained results of using a Markov model. In [15] and [16], reliability and MTTF are calculated for a multi-level
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