Improved inductive-system-level IEC ESD performance for automotive applications using mutual ballasted ESD protection technique

Abstract

A new ESD failure mode under inductive IEC stress of automotive Controller Area Network (CAN) bus is identified. Inductor saturation causes increase of the rise-time from 1ns to ~20ns, leading to non-uniform conduction in the bidirectional ESD protection circuit. A novel mutual ballasting layout technique is introduced to recover the system level ESD performance.