Abstract
This paper discusses an improved in-situ immunity mea- surement test bench of a microcontroller | PIC18F458 to conducted continuous wave interference (CWI). The updated measurement algo- rithm gives more accurate measurement result. Compared with nor- mal failure criterion, the DC shift failure criterion is adopted because it gives better description of the immunity behavior of the microcon- troller. Finally, the susceptibility results are explained in detail.
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