Abstract
AbstractWhile several mm‐wave and sub‐THz frequency bands are being proposed for next generation wireless systems to meet the increasing traffic demand, the electromagnetic properties of many common use materials at those frequencies still need to be determined. The evaluation of such properties is important for the design and deployment of future wireless networks. Recently, a simple method based on Fabry‐Pérot resonance has been proposed to address the need of easy material characterization at mm‐wave frequencies. In this study, the method has been improved and applied to the characterization of several materials at mm‐wave and sub‐THz frequencies, in order to assess its reliability, usability, and accuracy in practical cases. The method is shown to achieve a good accuracy level despite the very simple measurement setup and the great flexibility. However, some application limitations are highlighted and discussed in the paper. A method for electromagnetic material characterization based on an improved Fabry‐Pérot technique is presented.
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