Abstract
An improved practical method to simulate elastic electron scattering is described. Single scattering events are simulated using simple analytical expressions derived from the Wentzel model. The present paper shows that simulating with the Wentzel model reduces to a pure problem of optimization. Indeed, a novel method of optimization, based on genetic algorithms, has been applied so as to reproduce the values of the total elastic cross sections and the first and second transport cross sections obtained from partial wave calculations. The resulting model yields a simple analytical formula for the random sampling of the angular deflection that overcomes the problem of the unfeasibility of the detailed simulation when the energy of the incident particles is larger than a hundred keV.
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