Abstract
In this study, we provide and validate an enhanced dispersion-encoded full-range spectral interferometry that offers improved measurement accuracy for samples characterized by significant depth, inclination, and roughness. Due to the low intensity of the optical signal in these samples, the optical signal is easy to be overwhelmed by the disturbance terms, demanding a more precise phase compensation. To address this issue, the direct current is removed by subtracting the envelope of the interference spectrum, allowing the weak signal near zero optical delay can be identified. Besides, considering the unwrapped phase error caused by the spectrometer aberrations, only the data with good phase continuity are preserved, which improves the accuracy of phase compensation. Using the proposed technique, the depth measurement range of the system is extended from 6 mm to 12 mm, while achieving an axial measurement precision of 2.5µm. In addition, the full-depth images of a ceramic standard step block and a 3D-printed sample are measured. It shows that our system exhibits superior adaptation to complex surfaces compared to the laser line profiler.
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