Improved DC and RF performance in Si/SiGe n-MODFETs with ion-implanted buried p-well doping

Abstract

The dc and RF characteristics of Si/SiGe n-MODFETs with buried p-well doping incorporated by ion implantation are reported. At a drain-to-source biasV/sub ds/ of +1 V devices with 140-nm gate length had peak transconductance g/sub m/ of 450 mS/mm, and maximum dc voltage gain A/sub v/ of 20. These devices also had off-state drain current I/sub off/ of 0.15 mA/mm at V/sub g/=-0.5 V. Control devices without p-well doping had A/sub v/=8.1 and I/sub off/=13 mA/mm under the same bias conditions. MODFETs with p-well doping had f/sub T/ as high as 72 GHz at V/sub ds/=+1.2 V. These devices also achieved f/sub T/ of 30 GHz at a drain current, I/sub d/, of only 9.8 mA/mm, compared to I/sub d/=30 mA/mm for previously published MODFETs with no p-well doping and similar peak f/sub T/.