Abstract
The thin film metallic glass (TFMG) ZrCu coupled with ITO as a bi-layer electrode has potential to be transparent conductive films due to the promising sheet resistance of 20Ω/sq (or 1×10−4Ω-cm) and the transmittance of 73% at 550nm wavelength. In addition, it is demonstrated that, with the TFMG ZrCu interlayer in between PET and ITO under long-termed bending fatigue, the induced micro-cracks can be appreciably reduced, the service cycling fatigue performance can be pronouncedly improved, and a fairly stable electrical property can result in. The relative change of resistivity is below 0.4, significantly lower than that of the commercial PET/ITO product.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
