Abstract
A novel high resolution ion mobility spectrometer (HRIMS) equipped with an electrospray ionization (ESI) source was used to analyze trace levels of several energetic materials. The ESI-HRIMS system allowed rapid analysis of explosive samples that were difficult to detect using conventional IMS systems while providing resolving powers, R, greater than 60 and good sensitivity toward the troublesome homemade explosives (HME). This research demonstrated analysis of trace levels of explosives in both positive and negative ion modes, including thermally labile explosives such as TATP and PETN that are detected as their intact molecular ions. Ion mobility spectra and reduced mobility values ( K o) of common explosives were reported in good agreement with previously published values. The high performance IMS system provided a rapid, effective analytical tool that was a suitable upgrade for current explosive sample screening and routine analysis applications.
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