Abstract
A method for improving accuracy in Wigner–Ville distribution (WVD)-based particle size measurements from inline holograms using flip and replication technique (FRT) is proposed. The FRT extends the length of hologram signals being analyzed, yielding better spatial-frequency resolution of the WVD output. Experimental results verify reduction in measurement error as the length of the hologram signals increases. The proposed method is suitable for particle sizing from holograms recorded using small-sized image sensors.
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