Abstract
The imprint behavior of ferroelectric Pb(Zr,Ti)O3 (PZT) films with thin SrRuO3 (SRO) layers at the platinum electrodes was investigated. Different models (defect dipole alignment, bulk screening and interface screening) are discussed which are usually applied to explain the imprint effect in ferroelectric materials. Based on our experimental results for the material under investigation, we suggest that the interface screening mechanism is the dominant mechanism which is responsible for the imprint scenario in ferroelectric thin films.
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