Abstract
In this paper we show that the ambient temperature measured leakage time constant, τRT, is related to the leakage at cryogenic temperature, RC, byRC = 0.23ρDTVsh/τRTwhere ρDT is the density of cryogenic DT vapor, and Vsh is the internal volume of the shell. We then calculate the size of voids that may result from leakage at the Be/DT interface, depending upon the number of leakage sites and τRT. Even for the slowest leakers the potential void growth is excessive. Reasons that voids have not been seen in DT layering experiments to date include the lack of a technique to see isolated micronish bubbles, however possible mechanisms preventing void formation are also discussed.
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