Implementation of Waveguide Terminations With Low-Passive Intermodulation for Conducted Test Beds in Backward Configuration

Abstract

This letter proposes a simple procedure to implement low-passive intermodulation (PIM) terminations in waveguide technology to measure conducted backward PIM. The procedure consists in inserting a filter before the waveguide termination of the test bench. This approach reduces the PIM contribution from the load and, consequently, lowers the residual PIM noise floor of the test bench. To validate the procedure, a conducted backward low-PIM setup working in $K$ -band has been assembled and tested. The PIM performance improvement obtained fully confirms the validity of the proposed solution.