Implementation of a decision support system for scheduling semiconductor test operations

Abstract

Journal of Electronics ManufacturingVol. 03, No. 03, pp. 121-131 (1993) PAPERSNo AccessImplementation of a decision support system for scheduling semiconductor test operationsCHUNG-YEE LEE, LOUIS A. MARTIN-VEGA, REHA UZSOY and JIM HINCHMANCHUNG-YEE LEEDepartment of Industrial and Systems Engineering, University of Florida, Gainesville, FL 32611, USA Search for more papers by this author , LOUIS A. MARTIN-VEGACollege of Engineering, Florida Institute of Technology, Melbourne, FL 32901-6988, USA Search for more papers by this author , REHA UZSOYSchool of Industrial Engineering, 1287 Grissom Hall, Purdue University, West Lafayette, IN 47907-1287, USA Search for more papers by this author and JIM HINCHMANHarris Semiconductor Corporation, Melbourne, FL 32902, USA Search for more papers by this author https://doi.org/10.1142/S0960313193000140Cited by:22 PreviousNext AboutSectionsPDF/EPUB ToolsAdd to favoritesDownload CitationsTrack CitationsRecommend to Library ShareShare onFacebookTwitterLinked InRedditEmail AbstractThe problem of scheduling semiconductor test operations is a dynamic job shop scheduling problem complicated by the presence of machines with different scheduling characteristics and sequence-dependent setup times. The well-known intractability of job shop scheduling problems and the need to address multiple, conflicting management goals motivates the use of a decision support system (DSS) combining scheduling heuristics and existing information systems to support the scheduling function. The DSS is currently in use in two separate testing facilities, where management feels it has significantly improved shop performance and reduced production planning workload.Keywords:Semiconductor testingschedulingdecision support systems FiguresReferencesRelatedDetailsCited By 22Modeling and Solving Scheduling Problems in PracticeMichael L. 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Chiang and Fan-Yun Pai6 May 2006 | The International Journal of Advanced Manufacturing Technology, Vol. 33, No. 11-12Multi-objectives exception management model for semiconductor back-end environment under turnkey serviceR.-S. Guo, D. M. Chiang and F.-Y. Pai22 March 2007 | Production Planning & Control, Vol. 18, No. 3A parameterized-dispatching rule for a Logic IC sort in a wafer fabricationJ. T. Lin, F. K. Wang * and P. C. Kuo21 February 2007 | Production Planning & Control, Vol. 16, No. 5PRACTICE-FOCUSED RESEARCH ISSUES FOR SCHEDULING SYSTEMS*KENNETH MCKAY, MICHAEL PINEDO and SCOTT WEBSTER5 January 2009 | Production and Operations Management, Vol. 11, No. 2Scheduling semiconductor device test operations on multihead testersT. Freed and R.C. Leachman1 Nov 1999 | IEEE Transactions on Semiconductor Manufacturing, Vol. 12, No. 4A framework for decision support systems for scheduling problemsKlaus Ecker, Jatinder N.D. Gupta and Günter Schmidt1 Sep 1997 | European Journal of Operational Research, Vol. 101, No. 3A Generic Decomposition Procedure for Semiconductor Testing FacilitiesIrfan M. Ovacik and Reha Uzsoy1 Jan 1997An iterative heuristic for the single machine dynamic total completion time scheduling problemSuresh Chand, Rodney Traub and Reha Uzsoy1 Jul 1996 | Computers & Operations Research, Vol. 23, No. 7GLOBAL JOB SHOP SCHEDULING WITH A GENETIC ALGORITHMJEFFREY W. HERRMANN, CHUNG-YEE LEE and JIM HINCHMAN5 January 2009 | Production and Operations Management, Vol. 4, No. 1A REVIEW OF PRODUCTION PLANNING AND SCHEDULING MODELS IN THE SEMICONDUCTOR INDUSTRY PART II: SHOP-FLOOR CONTROLREHA UZSOY, CHUNG-YEE LEE and LOUIS A. MARTIN-VEGA1 Sep 1994 | IIE Transactions, Vol. 26, No. 5Decomposition algorithms for scheduling semiconductor testing facilitiesE. Demirkol, R. Uzsoy and I.M. Ovacik Recommended Vol. 03, No. 03 Metrics History Received 1 June 1993 Accepted 1 July 1993 KeywordsSemiconductor testingschedulingdecision support systemsPDF download