Implement of a CCD spectrometer as experimental set-up to evaluate the emission of an electroluminescent device using the Taguchi methodology

T Del Caño,A Sansano,M.A Rodrı́Guez-Pérez,A González,J.A De Saja

doi:10.1016/j.measurement.2003.09.002

Implement of a CCD spectrometer as experimental set-up to evaluate the emission of an electroluminescent device using the Taguchi methodology

T Del Caño, A Sansano + Show 3 more

https://doi.org/10.1016/j.measurement.2003.09.002

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Journal: Industrial Metrology	Publication Date: Oct 30, 2003
Citations: 2

Affiliation: University of Valladolid

#Taguchi Methodology #CCD Spectrometer + Show 8 more

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Abstract

Taguchi methodology was applied to study the influence of the electrical field variables on the emission yield and spectral response of a standard ZnS-based thin film electroluminescent device (TFEL). A measurement set-up based on a CCD spectrometer was designed and different TFEL working regimes were applied. As a result of the statistical analysis the optimal operation conditions were established and the influence of the external measurement factors were minimized.

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