Abstract
Bismuth layered structure ferroelectric (BLSF) ceramics of Aurivillius family is found to be interesting owing to the fact of its Scientific and Technological point view. In the present investigation, BLSF promising ceramic namely, strontium bismuth titanium zirconium oxide SrBi4Ti3.85Zr0.15O15 (SBTZ) was prepared by solid-state reaction method. Single phase formation with orthorhombic structure was confirmed by X-ray diffraction pattern. Scanning Electron Microscope (SEM) analysis was also carried out the said above sample. A detailed Raman spectroscopic analysis is studied to understand the bending and stretching vibration of octahedral. Electrical properties of the compound were extracted from impedance analysis. An attempt is made to corroborate the impedance results with the Raman data.
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