Abstract

The polycrystalline sample of tungsten bronze (TB) structured compound Na2Pb2Pr2W2Ti4V4O30, sample was prepared by a mixed‐oxide / solid state reaction technique. Preliminary structural studies with X‐ray diffraction data shows the formation of single phase compound. Electrical properties of the material have been studied using complex impedance spectroscopy technique. It appears that temperature dependent electrical parameters are strongly correlated to the microstructure (i.e., presence of bulk, grain boundary, etc) of the sample. An observation of a typical negative temperature coefficient of resistance (NTCR) of the sample shows semiconducting properties. The temperature dependent dc conductivity shows typical Arrhenius behavior. The sample obeys Jonscher's universal power law. The possibility of hopping mechanism for electrical transport properties of the system with non exponential type conductivity relaxation was found from Modulus analysis.

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