Abstract
Thin films of Nickel Phthalocyanine have been prepared by evaporation technique for (50 - 350 nm) of thickness. XRD studies show that the thin films have single crystalline structure for low thicknesses with (100) orientation and the crystallite size increased with increased thickness. Also from the AFM technique for NiPc films, the roughness was determined and the grain size increases with increasing of thickness from except at thickness 350 nm. The studies of electrical properties, morphology and orientations of the crystallites are important to understand and predict the nature of the films and essential for their successful applications in solar cell and sensors. The electrical properties of these films were studied with different thickness, NiPc has three activation energy. Carrier’s concentration and mobility was calculated. Hall measurements showed that all the films are p-type.
Highlights
Nowadays, semiconducting organic materials are very important since they have successful application in optical and electronic devices
The objective of this paper is to study the effect of thickness on the structural, compositional and electrical studies of Nickel phthalocyanine (NiPc) thin films prepared by vacuum evaporation technique
X-ray diffraction pattern of NiPc thin film with different thickness (50, 110, 265 and 350) nm are shown in Figure 1 respectively
Summary
Nowadays, semiconducting organic materials are very important since they have successful application in optical and electronic devices. Their thermally stable nature makes them suitable for thin film deposition by thermal sublimation. The electrical, optical and structural properties of phthalocyanine thin films depend on different parameters such as evaporation rate, substrate temperature and post-deposition annealing [3] [4]. In addition to their excellent photoconductive properties, Pc-s have the advantages of being very stable against thermal and chemical decomposition and present very intenseoptical absorption in the visible region. The objective of this paper is to study the effect of thickness on the structural, compositional and electrical studies of Nickel phthalocyanine (NiPc) thin films prepared by vacuum evaporation technique
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
