Abstract

Abstract We analyze data taken using a test bench with a prototype pad chamber designed to work in a high multiplicity environment. For this purpose we use the nonlinear methods presented in a previous paper. We show that the results which can be inferred from our simulation studies are well reproduced by real data. We also show that a global accuracy of 100 μm (⋍ 2% of the pad size) can easily be achieved. The influence of the pad spacing is studied and a way to account for it is proposed. We also discuss the quality of individual errors which can be computed on an event by event basis and show that they can be of the order of 20 to 50 μm (≈ 0.5–1% of the pad size). Methods which deal with ADC saturation effects are also illustrated.

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