Impact of technology scaling and process variations on RF CMOS devices

Abstract

Inspired by the huge improvement in the RF properties of CMOS devices, RF designers are invading the wireless market with all-CMOS RF transceivers and system-on-chip implementations. In this work, the impact of technology scaling on the RF properties of CMOS; frequency properties, noise performance, linearity, stability, and non-quasi static effects is investigated to provide RF designers with an insight to the capabilities of future CMOS technologies. Moreover, the RF frequency performance of CMOS is investigated under the influence of process variations for different CMOS generations. Using the BSIM4 model, it is found that future CMOS technologies have high prospects in the RF industry and will continue challenging other technologies in the RF domain to be the dominant technology for RF transceivers and system-on-chip implementations.